ni/semi-test-library-dotnet
May 2025 – Aug 2025
4 Months active
Languages Used
XMLC#
Technical Skills
Configuration ManagementHardware ConfigurationPin MappingSemiconductor TestingTest AutomationEmbedded Systems
deepika-ni
PROFILE
Deepika-ni
Deepika Karthikeyan developed and enhanced the ni/semi-test-library-dotnet repository over four months, focusing on scalable test automation for semiconductor hardware. She engineered a shared pin map framework supporting multi-instrument testing, standardized pin resources, and introduced persistent per-site and per-pin offsets to enable repeatable configurations. Using C#, XML, and LINQ, Deepika improved DCPower measurement logic, implemented skip operations for inactive sites, and expanded test coverage to validate edge cases. Her work emphasized maintainability and onboarding through schema and documentation updates, resulting in more reliable, efficient hardware testing pipelines and streamlined configuration management across digital, analog, and custom instrument workflows.
Overall Statistics
Feature vs Bugs
100%Features
Repository Contributions
11Total
Bugs
0
Commits
11
Features
5
Lines of code
509
Activity Months4
Your Network
41 people
Work History
August 2025
2 Commits • 1 Features
Aug 1, 2025Monthly summary for 2025-08: Delivered a robust shared-pin capability and improved DCPower measurements in ni/semi-test-library-dotnet, establishing cross-site test consistency and strengthening support for on-demand measurement scenarios. Key deliverables include persistence of per-site/per-pin offsets to disk and automatic loading, enabling repeatable configurations across digital levels and timing abstractions. Expanded test coverage underpins reliability for shared pin paths and DCPower measurement, reducing risk in production testing.
2 Commits • 1 Features
Aug 1, 2025Monthly summary for 2025-08: Delivered a robust shared-pin capability and improved DCPower measurements in ni/semi-test-library-dotnet, establishing cross-site test consistency and strengthening support for on-demand measurement scenarios. Key deliverables include persistence of per-site/per-pin offsets to disk and automatic loading, enabling repeatable configurations across digital levels and timing abstractions. Expanded test coverage underpins reliability for shared pin paths and DCPower measurement, reducing risk in production testing.
August 2025
July 2025
1 Commits • 1 Features
Jul 1, 2025July 2025 Monthly Summary for ni/semi-test-library-dotnet Key features delivered: - Shadow Site Exclusion from Operations: Implemented filtering to exclude sites marked as SkipOperations across instrument abstractions, so only active/intent channels are processed. This tightens configuration focus and improves measurement precision. - Related commit: 636e7762d8d390d69e8f227bee042747f3b4317f (Shared Pin | Exclude Shadow Sites (#285)) Major bugs fixed: - No major bugs fixed this month; focus remained on feature delivery and code quality improvements. Overall impact and accomplishments: - Enhanced data quality by restricting processing to active sites, reducing noise and misconfiguration. - Improved configuration clarity and measurement reliability across instrument abstractions. - Strengthened traceability with targeted changes linked to issue #285. Technologies/skills demonstrated: - .NET/C# development within a test library context. - Implementing filtering logic at the instrument abstraction layer. - Feature-driven delivery with clear commit messages and issue mapping. - Emphasis on maintainability and reliability of measurement pipelines. Business value: - Faster, more reliable measurements with fewer false positives; easier configuration for operators; improved data quality and confidence in results.
July 2025
1 Commits • 1 Features
Jul 1, 2025July 2025 Monthly Summary for ni/semi-test-library-dotnet Key features delivered: - Shadow Site Exclusion from Operations: Implemented filtering to exclude sites marked as SkipOperations across instrument abstractions, so only active/intent channels are processed. This tightens configuration focus and improves measurement precision. - Related commit: 636e7762d8d390d69e8f227bee042747f3b4317f (Shared Pin | Exclude Shadow Sites (#285)) Major bugs fixed: - No major bugs fixed this month; focus remained on feature delivery and code quality improvements. Overall impact and accomplishments: - Enhanced data quality by restricting processing to active sites, reducing noise and misconfiguration. - Improved configuration clarity and measurement reliability across instrument abstractions. - Strengthened traceability with targeted changes linked to issue #285. Technologies/skills demonstrated: - .NET/C# development within a test library context. - Implementing filtering logic at the instrument abstraction layer. - Feature-driven delivery with clear commit messages and issue mapping. - Emphasis on maintainability and reliability of measurement pipelines. Business value: - Faster, more reliable measurements with fewer false positives; easier configuration for operators; improved data quality and confidence in results.
June 2025
3 Commits • 2 Features
Jun 1, 2025June 2025 (2025-06) monthly summary for ni/semi-test-library-dotnet: Focused on enhancing instrument configurability, measurement efficiency, and reliability through pin map updates and DCPower workflow improvements. Key features delivered include updates to the SharedPin pin map and instrument mapping to reflect configuration changes and naming conventions, plus introduction of a new pin map pathway for custom instruments. In parallel, DCPower measurement logic was improved with per-channel skip capability and refined OnDemand handling to respect SkipOperations. Commit references included for traceability.
3 Commits • 2 Features
Jun 1, 2025June 2025 (2025-06) monthly summary for ni/semi-test-library-dotnet: Focused on enhancing instrument configurability, measurement efficiency, and reliability through pin map updates and DCPower workflow improvements. Key features delivered include updates to the SharedPin pin map and instrument mapping to reflect configuration changes and naming conventions, plus introduction of a new pin map pathway for custom instruments. In parallel, DCPower measurement logic was improved with per-channel skip capability and refined OnDemand handling to respect SkipOperations. Commit references included for traceability.
June 2025
May 2025
5 Commits • 1 Features
May 1, 2025May 2025 monthly summary for ni/semi-test-library-dotnet: Delivered cross-instrument Shared Pin Map Framework Enhancements enabling testing with DMM, DAQmx, Scope, and FGen; standardized pin resources; updated pin map schemas; and updated supporting materials. Improved test reliability, reduced setup time, and enabled scalable hardware testing across instruments. Drove maintainability and onboarding through documentation and schema improvements.
May 2025
5 Commits • 1 Features
May 1, 2025May 2025 monthly summary for ni/semi-test-library-dotnet: Delivered cross-instrument Shared Pin Map Framework Enhancements enabling testing with DMM, DAQmx, Scope, and FGen; standardized pin resources; updated pin map schemas; and updated supporting materials. Improved test reliability, reduced setup time, and enabled scalable hardware testing across instruments. Drove maintainability and onboarding through documentation and schema improvements.
Activity
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Quality Metrics
Correctness89.0%
Maintainability88.2%
Architecture87.2%
Performance85.4%
AI Usage20.0%
Skills & Technologies
Programming Languages
C#XML
Technical Skills
C#C# DevelopmentConfiguration ManagementDigital TestEmbedded SystemsHardware ConfigurationInstrument AbstractionInstrument ConfigurationInstrument ControlIntegration TestingLINQPin Map DefinitionPin MappingSemiconductor TestingTest Automation
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