
Scott Worley developed and modernized hardware support for Microchip MEC devices across Zephyr-based repositories, including nrfconnect/sdk-zephyr and zephyrproject-rtos/zephyr. He unified and refactored device drivers for GPIO, UART, SPI, and I2C, transitioning from HAL dependencies to in-tree, maintainable C implementations. Scott improved device tree organization, enabled SoC-managed power management, and expanded automated test coverage for multiple MEC families. His work leveraged C, CMake, and Device Tree Source (DTS), focusing on low-level hardware access, interrupt handling, and configuration management. These contributions enhanced platform scalability, reduced integration risk, and accelerated feature delivery for embedded systems using Zephyr RTOS.
March 2026 highlights focused on strengthening MEC hardware support and driver robustness in the Zephyr tree, with emphasis on I2C modernization, broader hardware coverage, and test stability across MEC172x/174x/5x/165x lines. The work delivered lays a stronger foundation for future MEC platforms and accelerates time-to-market for MEC-based products.
March 2026 highlights focused on strengthening MEC hardware support and driver robustness in the Zephyr tree, with emphasis on I2C modernization, broader hardware coverage, and test stability across MEC172x/174x/5x/165x lines. The work delivered lays a stronger foundation for future MEC platforms and accelerates time-to-market for MEC-based products.
February 2026 monthly summary: Focused on reliability, test stability, and energy efficiency for MEC-enabled Zephyr deployments. Delivered critical Device Tree corrections, stabilized SPI tests after API changes, and kicked off SoC managed power management for MEC architectures. These work items improve boot correctness, reduce test flakiness, and establish a foundation for power-aware operation.
February 2026 monthly summary: Focused on reliability, test stability, and energy efficiency for MEC-enabled Zephyr deployments. Delivered critical Device Tree corrections, stabilized SPI tests after API changes, and kicked off SoC managed power management for MEC architectures. These work items improve boot correctness, reduce test flakiness, and establish a foundation for power-aware operation.
January 2026: Delivered end-to-end SPI flash image generation support for MEC165xB and consolidated MEC5 HAL into the main Zephyr tree, alongside MEC5 device tree and hardware naming fixes. These changes simplify maintenance, improve cross-family compatibility, and enable faster, reliable image builds for MEC165xB/174x/175x families.
January 2026: Delivered end-to-end SPI flash image generation support for MEC165xB and consolidated MEC5 HAL into the main Zephyr tree, alongside MEC5 device tree and hardware naming fixes. These changes simplify maintenance, improve cross-family compatibility, and enable faster, reliable image builds for MEC165xB/174x/175x families.
December 2025 monthly summary: Delivered HAL-independent, in-tree MEC drivers across nrfconnect/sdk-zephyr and Zephyr RTOS, with device-tree modernization, cross-SOC compatibility, and unified hardware interfaces. Key outcomes include PINCTRL and device-tree modernization for MEC parts, unified MEC UART driver, MEC172x HAL-to-in-tree migration, SPI/QMSPI modernization with shared helpers, and expanded test coverage. These changes reduce HAL dependency, improve maintainability, and accelerate feature delivery across MEC boards.
December 2025 monthly summary: Delivered HAL-independent, in-tree MEC drivers across nrfconnect/sdk-zephyr and Zephyr RTOS, with device-tree modernization, cross-SOC compatibility, and unified hardware interfaces. Key outcomes include PINCTRL and device-tree modernization for MEC parts, unified MEC UART driver, MEC172x HAL-to-in-tree migration, SPI/QMSPI modernization with shared helpers, and expanded test coverage. These changes reduce HAL dependency, improve maintainability, and accelerate feature delivery across MEC boards.
Monthly summary for 2025-11 focusing on delivering a unified Microchip MEC GPIO driver and expanding test coverage in the sdk-zephyr repository. Highlights include deploying a common MEC GPIO driver across MEC parts with ISR/configuration workarounds; expanding test coverage by adding MEC evaluation boards to GPIO tests; and strengthening hardware support to enable faster MEC deployments. Key commits referenced: - cd6d7c9515dca17748c5fe4de155d71164d0a670: drivers: gpio: microchip: mec: One common driver for all MEC parts (with interrupt detection workaround) - 5dd9e8cd5915be65b5f8ab5a1e1864cf7735eb9e: tests: drivers: gpio: Add MEC boards to three GPIO driver tests (MEC15xx, MEC172x, MEC174x, MEC175x) This work delivers the following features and fixes: - Unified MEC GPIO driver across MEC parts and resilient ISR/interrupt configuration handling; - Added MEC boards to gpio_basic_api, gpio_api_1pin, and gpio_get_direction tests for MEC coverage.
Monthly summary for 2025-11 focusing on delivering a unified Microchip MEC GPIO driver and expanding test coverage in the sdk-zephyr repository. Highlights include deploying a common MEC GPIO driver across MEC parts with ISR/configuration workarounds; expanding test coverage by adding MEC evaluation boards to GPIO tests; and strengthening hardware support to enable faster MEC deployments. Key commits referenced: - cd6d7c9515dca17748c5fe4de155d71164d0a670: drivers: gpio: microchip: mec: One common driver for all MEC parts (with interrupt detection workaround) - 5dd9e8cd5915be65b5f8ab5a1e1864cf7735eb9e: tests: drivers: gpio: Add MEC boards to three GPIO driver tests (MEC15xx, MEC172x, MEC174x, MEC175x) This work delivers the following features and fixes: - Unified MEC GPIO driver across MEC parts and resilient ISR/interrupt configuration handling; - Added MEC boards to gpio_basic_api, gpio_api_1pin, and gpio_get_direction tests for MEC coverage.
July 2025 performance snapshot focused on delivering cross-board MEC integration improvements and strengthening test coverage, with an emphasis on business value and maintainable code reuse across Microchip MEC parts.
July 2025 performance snapshot focused on delivering cross-board MEC integration improvements and strengthening test coverage, with an emphasis on business value and maintainable code reuse across Microchip MEC parts.
June 2025 monthly summary across AmbiqMicro/ambiqzephyr, zephyrproject-rtos/zephyr, and nrfconnect/sdk-zephyr. Focused on enabling platform scalability and debugging capabilities for Microchip MEC devices, with cross-repo collaboration to support additional device families. Key outcomes include modular Device Tree organization for MEC devices to accommodate SAM and PIC32 families, fixes to interrupt routing for MEC5, and enhanced debugging support through Segger RTT. The work together improves maintenance, accelerates platform expansion, and strengthens the MEC feature set across Zephyr-based ecosystems.
June 2025 monthly summary across AmbiqMicro/ambiqzephyr, zephyrproject-rtos/zephyr, and nrfconnect/sdk-zephyr. Focused on enabling platform scalability and debugging capabilities for Microchip MEC devices, with cross-repo collaboration to support additional device families. Key outcomes include modular Device Tree organization for MEC devices to accommodate SAM and PIC32 families, fixes to interrupt routing for MEC5, and enhanced debugging support through Segger RTT. The work together improves maintenance, accelerates platform expansion, and strengthens the MEC feature set across Zephyr-based ecosystems.
January 2025 monthly summary focusing on hardware support delivery for PIC32CX. Expanded Zephyr repository telink-semi/zephyr to include PIC32CX family by updating the hal_microchip dependency in west.yml. This enables builds and testing for PIC32CX-based devices with reduced integration effort and improved reliability.
January 2025 monthly summary focusing on hardware support delivery for PIC32CX. Expanded Zephyr repository telink-semi/zephyr to include PIC32CX family by updating the hal_microchip dependency in west.yml. This enables builds and testing for PIC32CX-based devices with reduced integration effort and improved reliability.

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