Worked on the espressif/esp-bsp repository to address a reliability issue with the DS18B20 temperature sensor in embedded systems. Focused on C programming and device driver development, the contribution involved implementing detection for the sensor’s uninitialized power-on state, which previously led to invalid temperature readings after power cycles. This fix improved error handling and reduced false alarms, enhancing data reliability for downstream applications. Additional work included code formatting cleanups and updating the ds18b20 version to support upcoming release planning. The approach demonstrated attention to detail in embedded systems development and a methodical process for maintaining robust device driver code.