Developed backward-compatible mock device testing enhancements for the tenstorrent/tt-umd repository, focusing on robust support for legacy YAML cluster descriptors. The work involved implementing C++ logic to parse the legacy boardtype field and generate synthetic chip_unique_ids when absent, ensuring seamless compatibility with both older and modern descriptor formats. By integrating YAML parsing and backward compatibility handling, the solution enabled reliable testing across Wormhole N300 and N150 configurations. This feature also contributed to tt-metal’s mock device support with Fast Dispatch mode, aligning test coverage across platforms and reducing setup friction for legacy configurations, thereby improving the reliability and maintainability of test workflows.