
Tom Catley developed and integrated a disordered trace DNA width measurement feature for the AFM-SPM/TopoStats repository, focusing on enhancing the accuracy of DNA analytics in scientific computing workflows. Using Python, Tom implemented a static method for width calculation and connected it to the trace_image_disordered pipeline, enabling automated measurement for complex trace data. He expanded regression testing and test coverage to ensure reliability and maintainability, while also updating documentation to reflect the new functionality. Tom’s work included code cleanup and removal of debugging prints, resulting in a more maintainable codebase and supporting improved downstream data analysis and decision-making processes.

2024-11: Delivered Disordered Trace DNA Width Measurement in TopoStats (static calculate_dna_width, integration into trace_image_disordered), expanded test coverage and regression targets, updated docs, and cleaned up debugging prints. No major bugs fixed this month. Business value: higher accuracy in disordered-trace DNA width analytics and improved maintainability.
2024-11: Delivered Disordered Trace DNA Width Measurement in TopoStats (static calculate_dna_width, integration into trace_image_disordered), expanded test coverage and regression targets, updated docs, and cleaned up debugging prints. No major bugs fixed this month. Business value: higher accuracy in disordered-trace DNA width analytics and improved maintainability.
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